GNE半导体设备有限公司

GlobalNanotechEquipmentprovideshighqualitynewMaterialandLabEquipment,used,2ndhand,rebuiltandrefurbishedMetrologyEquipment(CD-SEM.FESEM,SEM,FIB),ElectronicTestEquipment,quartz,ceramic,siliconcarbide,siliconparts.Genmark、MECS、PRI/Equip、Brooks、Rorze、JELATM/EQUIPErobots、Controllers,Prealignersandothersemiconductorequipment,sales@

GlobalNanotechEquipmentisaleadingsupplierforhighqualitynewMaterialandLabEquipmentintheworld.Youmayfindalmosteverydesktopmachineneededinmaterialresearchataffordablecost.Ifyouneedsettingupamaterialsresearchlaboratory,biningmorethan30yearsofknowledgeandexperienceinmaterialresearch,wedesignandbuildalltypesoflabequipmentforresearchers,includingTubeFurnaces(1-5Zone),MuffleFurnaces(400-1800C),Hi-PressureFurnace,RTPFurnaces,LabOvens/HotPlates,DentalSinteringFurnaces,MeltingFurnaces,Inductionheaters&CZgrower,Cutting/DicingSaws,PolishingMachines,DesktopMachine-shop,FilmCoaters,GloveBox,LabPress&Rollers,LaboratoryMill/Mixer,Battery/CapacitorAnalyzers,Desk-TopX-RayInstruments,DigitalMicroscopes,DIWater/Ultrasonics,DigitalLabBalances,UVEquipment&Adhesives,LabWare/Accessory,RoundWaferCarriers,Sticky&FilmBoxes,ICTray&PlasticBoxes,VacuumPen&Tweezers.

OurusedMetrologyEquipmentisfullyreconditionedtomeetorexceedOEMspecificationsandcarriedobiningmorethan40yearsofknowledgeandexperienceinCD-SEM.FESEM,SEM,FIB,werefurbishmanytypesofCD-SEM.FESEM,SEM,FIBusedMetrologyEquipment,includingRefurbishedHitachiCD-SEMmodelS-8840,HitachiCD-SEMmodelS-8820,HitachiCD-SEMmodelS-9220,HitachiCD-SEMmodelS-9260,HitachiCD-SEMmodelS-9300,HitachiFE-SEMmodelS-4500,HitachiFE-SEMmodelS-4700,HitachiFE-SEMmodelS-4160,HitachiSEMS-2500ci,HitachiSEMS-2300,HitachiSEMS-2150,HitachiSEMS800,HitachiSEMS-570,JEOLJSM-840,LEO1550FieldEmissionSEM,LEOFE-SEMmodel982,MicrionFIBmodelM9500.WealsoprovidenewEnergyDispersiveX-RaySpectrometerQUANTAX200,XFlash5010DetectorcombinedwiththeusedSEMforourvaluablecustomers.

MetrologyEquipment

OurnewandusedElectronicTestEquipmentisfullyreconditionedtomeetorexceedOEMspecificationsandcarriedobiningmorethan20yearsofknowledgeandexperienceinElectronicTestEquipment,werefurbishmanytypesofElectronicTestEquipment,